Ключевые слова: HTS, YBCO, coated conductors, RCE-CDR process, critical caracteristics, current-voltage characteristics, uniformity, critical current, temperature dependence, angular dependence, trapped field distribution, magnetization, mechanical properties, stress effects, experimental results, presentation
Ключевые слова: HTS, coated conductors, REBCO, planarization, IBAD process, RCE-CDR process, fabrication, high rate process, long conductors, uniformity, critical caracteristics, critical current, critical current density, angular dependence, magnetic field dependence, review, fabrication, presentation
Ключевые слова: railway applications, power equipment, FCL resistive, modeling
Ключевые слова: power equipment, FCL resistive, power distribution system, modeling
Ключевые слова: railway applications, FCL resistive, power equipment, switches, modeling
Matias V., Coulter Y., Sheehan C., Yung C., Glyantsev V., Huh J., Turner P., Dawley J., Maiorov B.M.
Ключевые слова: HTS, coated conductors, fabrication, template layers, planarization, solution techniques, IBAD process, RCE-CDR process, critical caracteristics, n-value, critical current, critical current density, angular dependence, thickness dependence, magnetic field dependence, homogeneity, growth rate, presentation
Matias V., Maiorov B., Moeckly B., Coulter Y., Sheehan C., Yung C., Glyantsev V., Ruby W., Huh J., Turner P.
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, solution techniques, planarization, long conductors, co-evaporation process, critical caracteristics, critical current, critical current density, n-value, Jc/B curves, angular dependence, pinning, substrate Hastelloy, fabrication
Ключевые слова: MgB2, films, HPCVD process, fabrication, nanoscaled effects
Lee H.G., Jo W., Hammond R.H., Beasley M.R., Hong G.W., Yoon H.R., Lee R., Cheong H., Yoon S., Huh J.U.
Ключевые слова: MgB2, films, HPCVD process, composition, fabrication, substrate sapphire, resistivity
Ключевые слова: MgB2, films thick, films epitaxial, HPCVD process, fabrication, grain boundaries, pinning, critical current density, critical caracteristics
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